Authors: T. Reclik, S. Medghalchi, P. Schumacher, M. A. Wollenweber, T. Al-Samman, S. Korte-Kerzel, U. Kerzel

Abstract: Resolution enhancement of scanning electron micrographs using artificial intelligence.

Publication Info: Materials & Design, Vol 253 (113955), 2025. DOI: 10.1016/j.matdes.2025.113955 arXiv: 2410.03746